000 | 00517nab a2200157Ia 4500 | ||
---|---|---|---|
008 | 230808s2014 |||||||f |||| 00| 0 eng d | ||
100 |
_aHwang, Jung Yoon _9706581 |
||
100 |
_aLee, Hyun Cheol _9706582 |
||
245 | 0 | _aParametric Yield Modeling Using Hidden Varable Logistic Regression | |
300 | _a323-339 p. | ||
650 |
_aCritical Process Variable _9706583 |
||
650 |
_aHidden Variable _9706584 |
||
650 |
_aLogistic-Regression _9166825 |
||
773 |
_d2014 _tJournal of Quality Technology _x00224065 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c712027 _d712027 |