000 00517nab a2200157Ia 4500
008 230808s2014 |||||||f |||| 00| 0 eng d
100 _aHwang, Jung Yoon
_9706581
100 _aLee, Hyun Cheol
_9706582
245 0 _aParametric Yield Modeling Using Hidden Varable Logistic Regression
300 _a323-339 p.
650 _aCritical Process Variable
_9706583
650 _aHidden Variable
_9706584
650 _aLogistic-Regression
_9166825
773 _d2014
_tJournal of Quality Technology
_x00224065
942 _cART
_o51
_pABUL KALAM Library
999 _c712027
_d712027