| 000 | 00784nam a2200241Ia 4500 | ||
|---|---|---|---|
| 008 | 070612s2005||||xx |||||||||||||| ||eng|| | ||
| 020 | _a038725742X | ||
| 022 | _l0-387-25742-X | ||
| 041 | _aeng | ||
| 082 |
_a621.3815 _bKAB |
||
| 100 |
_aKabisatpathy, Prithviraj _eAU |
||
| 245 | 0 | _aFault Diagnosis of Analog Integrated Circuits | |
| 260 |
_aDordrecht : _bSpringer, _cc2005 |
||
| 300 |
_aIX, 182 p. _b: ill |
||
| 440 | _aFrontiers in Electronic Testing ; V. 30 | ||
| 504 | _aYY | ||
| 650 | _aLinear Integrated Circuits | ||
| 650 | _aLinear Integrated Circuits Testing | ||
| 700 |
_aBarua, Alok _eAU |
||
| 700 |
_aSinha, Satyabroto _eAU _91024 |
||
| 856 |
_yTable of Contents _uhttps://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/0-387-25742-X.pdf |
||
| 942 | _cBOO | ||
| 999 |
_c366838 _d366838 |
||