| 000 | 00665nam a2200217Ia 4500 | ||
|---|---|---|---|
| 008 | 070202s2006||||xx |||||||||||||| ||eng|| | ||
| 020 | _a0471739065 | ||
| 022 | _l0-471-73906-5 | ||
| 041 | _aeng | ||
| 082 |
_a621.38152 _bSCH |
||
| 100 |
_aSchroder, Dieter K. _eAU |
||
| 245 | 0 | _aSemiconductor Material and Device Characterization | |
| 250 | _a3rd | ||
| 260 |
_aHoboken, Nj : _bJohn Wiley, _cc2006 |
||
| 300 |
_aXV, 779 p. _b: ill |
||
| 504 | _aYY | ||
| 650 |
_aSemiconductors _9109 |
||
| 650 |
_aSemiconductors Testing _995119 |
||
| 856 |
_yTable of Contents _uhttps://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/0-471-73906-5.pdf |
||
| 942 | _cBOO | ||
| 999 |
_c365745 _d365745 |
||