000 | 00948nam a2200229Ia 4500 | ||
---|---|---|---|
008 | 070619s2005||||xx |||||||||||||| ||eng|| | ||
020 | _a352740502X | ||
022 | _l3-527-40502-X | ||
041 | _aeng | ||
082 |
_a620.50287 _bWIL |
||
100 |
_aWilkening, Gunter _eED _9108288 |
||
245 | 0 | _aNanoscale Calibration Standards and Methods Dimensional and Related Measurements in the Micro and Nanometer Range | |
260 |
_aWeinheim : _bWiley-Vch, _cc2005 |
||
300 |
_aXXII, 519 p. _b: ill |
||
504 | _aYY | ||
650 |
_aMicrostructures Measurement Congresses _9108289 |
||
650 |
_aNanostructured Materials Measurement Congresses _9108290 |
||
700 |
_aKoenders, Ludger _eED _9108291 |
||
711 |
_aNanoscale Calibration Standards and Methods Dimensional and Related Measurements in the Micro and Nanometer Range _9108292 |
||
856 |
_yTable of Contents _uhttps://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/3-527-40502-X.pdf |
||
942 |
_cPRO _o51 _pAbul Kalam Library |
||
999 |
_c364790 _d364790 |