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Fault Diagnosis of Analog Integrated Circuits

By: Contributor(s): Material type: TextTextLanguage: English Series: Frontiers in Electronic Testing ; V. 30Publication details: Dordrecht : Springer, c2005Description: IX, 182 p. : illISBN:
  • 038725742X
Subject(s): DDC classification:
  • 621.3815 KAB
Online resources:
Holdings
Item type Current library Shelving location Call number Status Date due Barcode
Lending Collection Lending Collection Circulation Section Circulation Section 621.3815 KAB Available 77327
Lending Collection Lending Collection Circulation Section Circulation Section 621.3815 KAB Available 76377