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Digital Device Manuals for Management of Connected Spaces by
  • Sridharan, R
Source: Ieee Communications Magazine
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Time - and Frequency - Domain Transient Signal Analysis for Defect Detection in Cmos Digital Ic'S. by
  • Plusquellic, James F
  • Chiarulli, Donald M
  • Levitan, Steven P
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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