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Universal Error Corrections for Finite Semiconductor Resitivity in Cross - Kelvin Resistor Test Structures by
  • Holland, Anthony S
  • Reeves, Geoffrey K
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Angle Server for Cross-Provider Service Peering and Aggregation by
  • Falchuk, Ben
  • Cheng, Kong E
Source: Ieee Communications Magazine
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Identification of Cross-Sectional Parameters of Lateral Meniscal Allografts That Predict Tibial Contact Pressure in Human Cadaveric Knees by
  • Huang, B
Source: Transactions ofAsme, Journal of Biomechanical Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Wideband Tdoa/Ddoa Processing Using Summation of Short-Time Caf'S by
  • torres, Wade P
  • Geraniotis, Evaggelos
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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