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A March Test for Functional Faults in Semiconductor Random Access Memories by
  • Reddy, S. M
  • Suk, D.S
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Force Stream Funtion Method by
  • Wu, tom
Source: The Journal of Strain Analysis for Engineering Design
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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onDesign of Fast, Easily Testable Alu'S. by
  • Blanton, R. D
  • Hayes, J. P
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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