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onRetention Time Distribution of Dynamic Random Access Memory (Dram) by
  • Hamamoto, Takeshi
  • Sugiura, S
  • Sawada, Shunichi
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Cotio3 High-K Dielectrics on Hsg for Dram Applications by
  • Chao, Tien-Sheng
  • Ku, Wei-Ming
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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