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Test Vehicle for a Wafer-Scale Field Programmable Gate Array by
  • Du for t, Benoit
  • Chapman, G. H
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Impact of Gate-to-Source/Drain Overlap Length on 80-Nm Cmos Circuits Performance by
  • Maitra, Kingsuk
  • Bhat, Navakanta
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Control ofSwitching Transients of Igbt Series Strings By High-Performance Drive Units by
  • Raciti, A
  • Belverde, G
  • Galluzzo, A
  • Greco, G
Source: IEEE Transactions on Industrial Electronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Novel Resonant Gate Driver for High Frequency Synchronous Buck Converters by
  • Yao, M
  • Lee, S.K
Source: Ieee Transactions on PowerElectronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
The Series Connection of Igbt'S with Active Voltage Sharing. by
  • Githiari, A. N
  • Palmer, P. R
Source: Ieee Transactions on PowerElectronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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