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A Physical-Based Analytical Tun-on Model of Polysilicon Thin-Film Transistors for Circuit Simulation by
  • Yang, G
  • Hur, SunGWOo
  • Han, Chul-Hi
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Analytical Modelling ofKink Regime of A Short Channel Polycrystalline Silicon Thin Film Transistor by
  • Chopra, S
  • Sehgal, A
Source: International Journal of Electronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test by
  • Venuto, D. De
  • Kayal, M
  • Ohletz, M.J
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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