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A Critique OfReliability Analysis Center Failure-Rate-Model for Plastic Encapsulated Microcircuits by
  • Shukla, Anand A
  • Pecht, Michael G
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Rebuttal To: a Critique OfReliability-Analysis-Center Failure-Rate-Model for Plastic Encapsulated Microcircuits by
  • Denson, Wililam
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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