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Step-Stress life-Testing with Random Stress-Change Times for Exponential Data by
  • Xiong, Chengjie
  • Mililken, George A
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
WiliReal Iris Data Please Stand Up? by
  • Bezdek, James C
  • Kelier, James M
  • Krishnapuram, Raghu
  • Kuncheva, L.I
Source: IEEE Transactions on Fuzzy Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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