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		Quantitative Assessment of Protection System Reliability Incorporating Human Errors by Fotuhi-Fuiruzabad, M Elemadi, A.H Source: Journal of Risk and Reliability: Proceedings OfI Mech E Part-O Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design of a Fault Tolerant Solid State Mass Memory by Cardarilil, G. C Leandri, Alessandro Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design of Totaliy Self-Checking Checker for 1-Out-Of-3 Code by Golan, Petr Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design of Self-Checking Sequential Machines by Dhawan, Sudhir De Vries, Ronald C Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design of Self-Checking Iterative Networks by Dhawan, Sudhir De Vries, Ronald C Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Definition and Design of Strongly Language Disjoint Checkers by Courtois, Bernard Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Strongly Code Disjoint Checkers by Nicolaidis, Michael Courtois, Bernard Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design of Testable Structures Defined by Simple Loops by Abraham, Jacob A Gajski, Daniel D Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Desing of Self-Checking Fully Differential Circuits and Boards. by Lubaszewski, M Mir, S Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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