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Compound Noise: Evaluation as a Robust Design Method by
  • Singh, Jagmeet
  • Frey, Daniel D
  • Soderborg, Nathan
Source: Quality and Reliability Engineering International
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Simulation and Modeling of Self-Modulated Re-Entrant Beam Crossed-Field Amplifier by
  • Churyumov, Gennadiy I
  • Sergeev, Gennadiy I
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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