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Pixel-Wise Noise Level Estimation for Images by
  • Amano, Yusuke
Source: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Test Vehicle for a Wafer-Scale Thermal Pixel Scens Simulator by
  • Chapman, G. H
  • Carr, L. S
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Cmos Active Pixel Pixel Image Sensors Fabricated Using a 1.8-V, 0.25- Cmos Technology by
  • Wong, Hon-Sum Philip
  • Chang, Richcrd T
  • Agnelio, Paul D
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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