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		New Noise Tolerance Improvement Techniques for Dynamic Logic Circuits by Paliwal, Viveka Chandel, Rajeevan SARkar, Sankar Source: Journal of Active and Passive Electronic Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Efficient and Accurate Compact Model for Thin Oxide Mosfet by liu, Weidong King, Yachin Hu, Chenming Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Long-Term Electron Leakage Mechanisms Through ono Interpoly Dielectric in Stacked-Gate Eeprom Cells by Kim, Jang-Han Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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