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Improved Methods for Exponential Parameter Estimation InPresence of Known Poles and Noise. by
  • Chen, H
  • Van Huffel, S
  • Vandewalle, J
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Improved Signal Enhancement Procedures Applied to Exponential Data Modeling by
  • Dologlou, I
  • Van Huffel, S
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
onEquivalence of Constrained total Least Squares and Structured total Least Squares. by
  • Lemmerling, P
  • De Moor, B
  • Van Huffel, S
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
for mulation and Solution of Structured total Least Norm Problems for Parameter Estimation. by
  • Rosen, J. B
  • Van Huffel, S
  • Park, H
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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