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Hot Carrier Degradation ofLow-Frequency Noise in Mos Transistors Under Analog and Rf Operating Conditions by
  • Brederlow, Ralf
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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A Mixed-Signal Design Roadmap by
  • Brederlow, Ralf
  • Weber, Werner
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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