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		Critical Discussion ofFront-Back Gate Coupling Effect onLow-Frequency Noise in Fully Depleted Soi Mosfets by Simoen, E Mercha, A Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Linear Kink Effect Induced By Electron Valence Band Tunneling in Ultrathin Gate Oxide Bulk and Soi Mosfets by Rafi, J M Simoen, E Claeys, C Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Low-Frequency Noise in Polysilicon -Emitter Bipolar Transistors by Deen, M.J Simoen, E Source: Iee Proceedings:Circuits, Devices and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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