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Long Lossy lines (L3) and Their Impact Upon Large Chip Performance by
  • Davidson, Evan E
  • Mccredie, Bradley D
  • Vilkelis, Valter V
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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The Design OfEs/9000 Module by
  • Davidson, Evan E
  • Katopis, George A
  • Wu, L. L
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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