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Modeling of Alpha-Particle-Induced Soft Error Rate in Dram by
  • Shin, Hyungsoon
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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An Asymmetric Halo by Large- Angle -Tilt Implant Mosfet for High Performance and Reliability by
  • Shin, Hyungsoon
  • Lee, Seung Jun
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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A New Weight Redistribution Techique for Electron-Electron Scattering InMic Simulation by
  • Kim, Jongchol
  • Shin, Hyungsoon
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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