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		Substrate-Bias Effect and Source Drain Breakdown Characterisics in Body-Tied Short Channel Soi Modfet'S by Maeda, Shigenobu Yamaguchi, Y Iwamaguchi, Yasuo Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Analytical Method of Evaluating Variation OfThreshold Voltage Shift Caused byNegative-Bias Temperature Stress in Poly-Si Tft'S by Maeda, Shigenobu Maegawa, Masumi Ipposhi, Talashi Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Analysis of Delay Time Instability According ToOperatIIng Frequency in Field Shield Isolated Soi Corcuits by Maeda, Shigenobu Yamaguchi, Y Ueda, Kimio Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Analytical Method of Evaluating Variation of Th Threshold Voltage Shift Caused byNegative-Bias Temperature Stress in Poly-Si Tft'S by Maeda, Shigenobu Maegawa, Masumi Kuriyama, Hirotada Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Artificial Fingerprint Device (Afd): A Study of Identification Number Applications Utilizing Characteristics Variation of Polycrystalline Silicon Tfts by Maeda, Shigenobu Kuriyama, Hirotada Inoue, Yasuo Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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