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Extending Integrated-Circuit Yield-Models to Estimate Early-life Reliability by
  • Singh, Adit D
  • Nelson, Victor P
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Failure Dependent Bandwidth in Shuffle-Exchange Networks by
  • Nelson, Victor P
  • Bisbee, Charles R
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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