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Electrical Modeling of Intercace Roughness in Thin Film Electroluminescent Devices by
  • Neyts, Kristiaan
  • Visscher, Patrick M. J. De
  • Stuyven, Gert
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Simulation and Measurement of Multiplication in Thin-Film Electroluminescent Devices with Doped Probe Layers by
  • Neyts, Kristiaan
  • Corlatan, Dorina
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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