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		Trading Off Programming Speed and Current Absorption in Flash Memories with Ramped Gate Programming Technique by Esseni, David Ricco, Bruno Tassan, S Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A New and Flexible Scheme for Hot-Electron Programming of Nonvolatile Memory Celis by Esseni, David Cappelietti, Paolo Ricco, Bruno Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Modeling and Simulation of Stress-Induced Leakage Current in Ultrathin Sio2 Films by Ricco, Bruno Gozzi, Gianfranco Lanzoni, Nassimo Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Erratic Cell Behavior in Channel Hot Electron Programming of Nor Flash Memories by Grossi, Marco Lanzoni, Massimo Ricco, Bruno Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Novel Algorithm for High-Throughput Programming of Multilevel Flash Memories by Grossi, Marco Lanzoni, Massimo Ricco, Bruno Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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