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A Holographic Measurement of Microscopical Sliding of Electrical Contact Due to Contact Spring Thermal Deformation by
  • Taniguchi, M
  • Sone, Hideaki
  • Takagi, Tasuku
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Basic Study onApplicatoin of Prametric Spline Functions toHolographic Pattern Measuring System. by
  • Taniguchi, M
  • Takagi, T
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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