Your search returned 3 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
Cover image
Semiconductor Material and Device Characterization by
  • Schroder, Dieter K [author]
Edition: 3rd
Material type: Text Text
Language: English
Publication details: Hoboken, Nj : John Wiley, c2006
Online access:
Availability: Items available for loan: Circulation Section (4)Location, call number: Circulation Section 621.38152 SCH, ...
Cover image
Semiconductor Material and Device Characterization by
  • Schroder, Dieter K [author]
Edition: 2nd
Material type: Text Text
Language: English
Publication details: New York : Wiley Interscience, c1998
Online access:
Availability: Items available for loan: Circulation Section (2)Location, call number: Circulation Section 621.38152 SCH, ...
Measurement Time Reduction for Generation lifetimes by
  • Lee, Sang-Yun
  • Schroder, Dieter K
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Pages