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		Influence of Novel Mos Varactors onPerformance of A Fully Integrated Umts Vco in Standard 0.25-Um Cmos Technology by Kraus, R Maget, Judith Tiebout, Marc Source: Ieee Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Effect of Ionizing Radiation on Mos Capacitors by Chauhan, R.K Chakrabarti, P. P Source: Microelectronics Journal Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		The Dv/Dt Capability of Mos-Gated Thyistors. by Venkataraghavan, P Baliga, B. J Source: Ieee Transactions on PowerElectronics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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