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I/F Noise in Si and Sio.7 Geo.3 Mosfets by
  • Haartman, Martin Von
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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An Alternative Method for Transistor Low Frequency Noise Estimation By Measuring Phase Noise of Test Oscillator by
  • Jevtic, Milan N
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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