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A Patern Reordering Approach Based on Ambiguity Detection for online Category Learning by
  • Granger, Eric
  • Savaria, Yvon
Source: Ieee Transactions on Pattern Analysis and Machine Intelligence
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Finding Ambiguity Group in Low Testability Analog Circuit. by
  • Piccirilli, M. C
  • Pang, J
  • Starzyk, J. A
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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