Your search returned 2 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
Experimental Investigation ofImpact of Lwr on Sub-100-Nm Device Performance by
  • Kim, Hyun-Woo
  • Lee, Ji-Young
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Face Recognition Using Line Edge Map by
  • Gao, Yongsheng
  • Leung, andrew Y.T.Leung
Source: Ieee Transactions on Pattern Analysis and Machine Intelligence
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Pages