Average Drift Mobilty and Apparent Sheet-Electron Density Profiles in Strained-Si-Sige Buried-Channel Depletion-Mode N-Mosfets

By: Material type: ArticleArticleDescription: 1309-1314 pSubject(s): In: Ieee Transactions on Electron Devices
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.51, No.08 (Aug. 2004) Available