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		Cycling Endurance of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact of Technological Parameters and Scaling by Nair, Deleep R Shukuri, S Mahapatra, S Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Two-Dimensional Analytical Modeling of Fully Depleted Dmg Soi Mosfet and Evidence for Diminished Sces by Kumar, Jagadesh Chaudhry, Anurag Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Chisel Flash Eeprom-Part I: Performance and Scaling by Mahapatra, S Shukuri, S Bude, J Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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