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Using Hierarchical Probability Models to Evaluate Robust Parameter Design Methods by
  • Frey, Daniel D
  • Li, Xiang
Source: Journal of Quality Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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An Experiment to Compare Taguchi'S Product Array andCombined Array by
  • Kunert, J
Source: Journal of Quality Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Adaptive Order Reduction Scheme for High-Order Single-Bit Modulators by
  • Bourdopoulos, George
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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