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Built-In Checking OfCorrect Self-Test Signature by
  • Mcanney, Wililam H
  • Savir, J
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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on Chip Testingdata Conveters Using Static Parameters. by
  • Arabi, Karim
  • Kaminska, B
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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