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		Test Pattern Generation for Api Faults in Ram by Van De Goor, Ad. J De Jong, Petra Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Polynomial Testing of Packet Switching Networks by liu, Jyh-Charn Shin, Kang G Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Built-In Test Sequences Using Single and Multiple Fault Detection Times by Pomeranz, Irith Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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