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Sequential Tests for Integrated-Circuit Failures by
  • Chandramouli, R
  • Vijaykrishnan, N
  • Ranganathan, N
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Non-In Formative and Practical Bayesian Confidence Bounds for Reliable life InWeibuli Model by
  • Erto, Pasquale
  • Rapone, Mario
Source: Reliability Engineering : an International Journal
Material type: Article Article; Format: print
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A Weibuli Model to Characterize lifetimes of Aluminum Alioy Electrical Wire Connections by
  • Joyce, Carol F
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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