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Macromodeling of Single-Electron Transistors for Efficient Circuit Simulation by
  • Yu, Yun Seop
  • Hwang, Sung Woo
  • Ahn, Doyeol
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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A Determintistic Nonlinear-Capacitor Model for Single-Electron Tunneling Junctions by
  • Hanggi, M
  • Chua, L.O
Source: Ieee Transactions on Circuits and Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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