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Possibilities and limitations of Testing in Submicron Cmos by
  • Figueras, Joan
  • Ferreira, A
Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Fault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test by
  • Venuto, D. De
  • Kayal, M
  • Ohletz, M.J
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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