Your search returned 4 results.

Results
		Interface Trap Generation by Fn Injection Under Dynamic Oxide Field Stress by Chen, T.P Lo, K. F li, Stelia Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Post-Stress Trap Generation Induced by Oxide-Field Stress with Fn Injection by Chen, T.P li, Stelia Fung, S Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Hierarchical Reliability Analysis for Circuit Design Evaluation by Riege, S. P Thompson, C. V Clement, J. J Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Sequential Tests for Integrated-Circuit Failures by Chandramouli, R Vijaykrishnan, N Ranganathan, N Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search