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		Parasitic Capcitance of Submicrometer Mosfet'S by Suzuki, Kunihiro Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		High-Power Soi Vertical Transistors with Lateral Drain : Process Developments Characterization, and Modeling by Pinardi, Kuntjoro Heinle, Ulrich Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Frequency Analysis of Electrical Impedance tomography System. by Rucki, Z Szczepanik, Z Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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