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Minimax Approach to Accelerated life Tests by
  • Ginebra, Josep
  • Sen, Ananda
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Minimax Design of Fir Digital All-Pass Filters. by
  • Chieu, B. C
  • Lin, C. S
  • Chao, H. C
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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