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Thermal limitation in Optical Recording by
  • Nelson, Douglas J
  • Vick, Brian
Source: IEEE Transactions on Components Packaging and Manufacturing Technology Part A
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Assessment ofPerformance of Laser-Based Lateral-Crystallization Technology Via Analysis and Modeling of Polysilicon Thin-Film-Transistor Mobility by
  • Voutsas, Apostolos T
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Nonmelt Laser Annealing of 5-Ke V and 1-Ke V Boron-Implanted Silicon by
  • Earles, S
  • Law, M
  • Brindos, R
  • Jones, K
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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