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Selectively Breaking Data Dependences to ImproveUtilization of Idle Cycles in Algorithm Level Re-Computing Data Paths by
  • Wu, Kaijie
  • Karri, Ramesh
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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online Testing Approach for Very Deep-Submicron Ics by
  • Favalli, Michele
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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