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Investigation on Device Characteristic of Mosfet Transistor Placed Under Bond Pad for High Pin Count Soc Applications by
  • Ker, Ming-Dou
  • Peng, Jeng-Jie
Source: IEEE Transactions on Components and Packaging Technologies
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Temperature Cycling Effects Between Sn/Pb Solder and Thick Film Pd/Ag Conductor Metalilzation by
  • Chiou, Bi-Shiou
  • liu, K. C
  • Duh, Jenq-Gong
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Relation Between Delamination and Temperature Cycling Induced Failures in Plastic Packaged Devices by
  • Van Doorselaer, Karel
  • De Zeeuw, Kees
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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