Your search returned 4 results.

Results
		Very Slow Charge Trapping and Release in Ion Implanted Gaas by Chiu, Chi-Hsin Boroumand, Farhad A Swanson, J. Garth Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Measurement of Mosfet Substrate Dopant Profile Via Inversion Layer-To-Substrate Capacitance by Hsu, C. H Chiang, Charles Yu-Teh Yeow, Yew Tong Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Analysis of Bias Stress on Unpassivated Hydrogenated Amorphous Silicon Thin-Film Transistors by Slade, Holiy Claudia Shur, Michael S Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Quantum Effects onExtraction of Mos Oxide Traps by 1/F Noise Measurements by Pacelil, A Vilia, Stefano Lacaita, andrea L Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search