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Effect of Code Coverage on Software Reliability Measurement by
  • Wong, W. Eric
  • Lyu, Michael R
  • Chen, Mei-Hwa
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Functional Verification of Instruction Processing Units Through Control Flow Modeling by
  • Feig, Rami
  • Weiss, S
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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