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		A 76-Mm2 8-Mb Chain Ferroelectric Memory by Takashima, Daisaburo Takeuchi, Yoshiaki Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A March Test for Functional Faults in Semiconductor Random Access Memories by Reddy, S. M Suk, D.S Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A 32-Mb Chain Feram with Segment/Stitch Array Architecture by Roehr, Thomas Jacob, Michael Beitel, Gerhard Source: Ieee Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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