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0. 18- Cmos 10-Gb/S Multiplexer/Demultiplexer Ics Using Current Mode Logic with Tolerance to Threshold Voltage Fluctuation by
  • Tanabe, Akira
  • Fujiwara, Ikuo
  • Ogura, Takeshi
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
High-Performance Deep Submicron Cmos Technologies with Polycrystalilne-Sige Gates by
  • Ponomarev, Youri V
  • Stolk, Peter A
  • Salm, Cora
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Advanced Thin-Film Silicon -on-Sapphire Technology Microwave Circuit Applications by
  • Johnson, Robb A
  • Houssaye, Paul R. De Ia
  • Lagnado, Isaac
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Electrical Characteristics of Orientation Cmosfet with Source Drain Fabricated by Various Ion -Implantation Methods by
  • Matsuda, T
  • Okina, Mika
  • Ohzone, Takashi
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Thin Silicide Development for Fuliy-Depleted Soi Cmos Technology by
  • liu, Harvey I
  • Burns, James A
  • Wyatt, Peter W
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Influence of Asymmetric/Symmetric Source /Drain Region on Asymmetry and Mismatch of Cmosfet'S and Circuit Performance by
  • Ohzone, Takashi
  • Miyakawa, Tetsu
  • Yabu, Toshiki
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Effect of Floating-Body Charge on Soi Mosfet Design by
  • Wei, andy
  • Sherony, Melanie J
  • Antoniadis, Dimitri A
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Bias-Temperature Instabilities of Polysilicon Gate Hfo2 Mosfets by
  • Han, Jeong
  • Choi, Rino
  • Nieh, Renee E
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Recoiled-Oxygen-Free Processing for 1.5 Nm Sion Gate-Dielectric in Sub-100-Nm Cmos Technology by
  • togo, M
  • Kimura, S
  • Mogami, T
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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